Total Run Time(H:M:S) = 1:20:40
Total fail Counts = 5280
Erase fail Counts = 4820
Program fail Counts = 0
Read fail Counts = 460
Highest Recorded Temperature = 64'C
RDT firmware version = S0829A0
RDT firmware version (from Result) = S0829
=== RDT SETTING =========================================
SLC => Test Loop = 1, ECC TH = 30 bits
Non-SLC => Test Loop = 1, ECC TH = 50 bits
RDT Read Retry => Disable
Bypass status fail bit => Disable
Force single plane program => Disable
Delay 30 minutes to read check => Disable
Pre-Check good block quantity => Disable
Spectek NAND special test => Disable
Erase soon after read check => Disable
Max Active Interleave Way => 4-Way
Thermal Throttling Temperature => 90'C
Thermal Throttling Flash Clock => 100Mhz
Test Block Cnt => All blocks
Test Type => Write All Block then Read
Test Mode => Erase + Program + Read
Read Type => Read check for all loop
Reference Mode => No Ref Mode
TemperatureTH => Don't care
EraseFailCntTH => Don't care
ProgFailCntTH => Don't care
ReadFailCntTH => Don't care
BadBlockCntTH/Die => Don't care
=========================================================